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Improve test coverage for %I32d used with scanf()

This commit is contained in:
Dmitry-Me 2019-11-19 18:05:21 +03:00
parent 479fbb85a2
commit cfac54c42a
1 changed files with 1 additions and 1 deletions
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2
test/testio.cpp
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@ -1825,7 +1825,7 @@ private:
TEST_SCANF_WARN("%I32d", "__int32", "bool"); TEST_SCANF_WARN("%I32d", "__int32", "bool");
TEST_SCANF_WARN("%I32d", "__int32", "void *"); TEST_SCANF_WARN("%I32d", "__int32", "void *");
//TODO TEST_SCANF_WARN_AKA("%I32d", "__int32", "size_t", "unsigned long", "unsigned long long"); TEST_SCANF_WARN_AKA("%I32d", "__int32", "size_t", "unsigned long", "unsigned long long");
//TODO TEST_SCANF_WARN_AKA_WIN32("%I32d", "__int32", "ssize_t", "signed long", "signed long long"); //TODO TEST_SCANF_WARN_AKA_WIN32("%I32d", "__int32", "ssize_t", "signed long", "signed long long");
TEST_SCANF_WARN_AKA("%I32d", "__int32", "ptrdiff_t", "signed long", "signed long long"); TEST_SCANF_WARN_AKA("%I32d", "__int32", "ptrdiff_t", "signed long", "signed long long");
TEST_SCANF_NOWARN("%I32d", "__int32", "__int32"); TEST_SCANF_NOWARN("%I32d", "__int32", "__int32");